Graefelfing, Germany | March 26, 2026TOPTICA Photonics announces the launch of its X-band Metrological Microwave Solution (X-MMS), a commercially available ultra-low-noise microwave source that ranks among the purest signals achieved worldwide. Developed using photonic technology, the system transfers the stability of an optical reference into the microwave domain, enabling unprecedented signal purity and stability in an industrial-grade platform.
From Optical Stability to Microwave Precision
Unlike conventional electronic microwave sources, the X-MMS derives its signal from an extremely stable laser using optical frequency division. This approach leverages the superior performance of optical resonators to generate a 9.6 GHz microwave signal with exceptionally low phase noise and high frequency stability.
Benchmark Performance in Phase Noise and Stability
The system achieves a single-sideband phase noise of –102 dBc/Hz at 1 Hz offset and reaches below -166 dBc/Hz at higher offset frequencies, placing it among the top-performing microwave sources reported to date. Its fractional frequency instability is as low as 2.8 × 10⁻¹⁶ at 1 second averaging time. Such performance is critical for demanding applications including atomic clocks, radio astronomy, frequency metrology, and emerging quantum technologies. These fields rely on ultra-stable microwave signals to ensure precise timing, synchronization, and measurement accuracy.
Broader impact of Quantum Technologies
“This is an exciting time to see critical advances in quantum technologies benefiting other fields.” – says Dr. Mikhail Volkov, Director of Research in Quantum Technologies at TOPTICA. “Built entirely from industry-grade TOPTICA components developed for quantum applications, our commercial X-band microwave solution brings metrology-grade performance to an industry-ready platform. See how our phase-noise compares with the world’s best results in the accompanying white paper – you may do a double take.”
Core Technology: Difference Frequency Comb
At the core of the system is TOPTICA’s Difference Frequency Comb technology, which enables intrinsically offset-free operation and contributes to both low noise and long-term stability. The platform can also be referenced to external standards such as atomic clocks or GPS signals, ensuring SI-traceable measurements for real-world applications.
Bringing Ultra-Pure Microwaves to Applications
Metrology-grade local-oscillator performance opens new possibilities in advanced test and measurement and in the development of compact, high-end RF systems. X-MMS enables faster, more accurate measurements and accelerates high-end RF development. This development reflects a broader trend in photonics, where advances in laser and frequency comb technologies are enabling the transfer of scientific breakthroughs into practical tools for industry.
The full technical background and performance data are outlined in a recently published white paper "X-BAND METROLOGICAL MICROWAVE SOLUTION" by Sebastian Müller, Dr. Mikhail Volkov, and Dr. Thomas Puppe.
Graefelfing, Germany | March 26, 2026 TOPTICA Photonics announces the launch of its X-band Metrological Microwave Solution (X-MMS), a commercially available ultra-low-noise microwave source that ranks among the purest signals achieved worldwide. Developed using photonic technology, the system transfers the stability of an optical reference into the microwave domain, enabling unprecedented signal purity and stability in an industrial-grade platform.
From Optical Stability to Microwave Precision
Unlike conventional electronic microwave sources, the X-MMS derives its signal from an extremely stable laser using optical frequency division. This approach leverages the superior performance of optical resonators to generate a 9.6 GHz microwave signal with exceptionally low phase noise and high frequency stability.
Benchmark Performance in Phase Noise and Stability
The system achieves a single-sideband phase noise of –102 dBc/Hz at 1 Hz offset and reaches below -166 dBc/Hz at higher offset frequencies, placing it among the top-performing microwave sources reported to date. Its fractional frequency instability is as low as 2.8 × 10⁻¹⁶ at 1 second averaging time. Such performance is critical for demanding applications including atomic clocks, radio astronomy, frequency metrology, and emerging quantum technologies. These fields rely on ultra-stable microwave signals to ensure precise timing, synchronization, and measurement accuracy.
Broader impact of Quantum Technologies
“This is an exciting time to see critical advances in quantum technologies benefiting other fields.” – says Dr. Mikhail Volkov, Director of Research in Quantum Technologies at TOPTICA. “Built entirely from industry-grade TOPTICA components developed for quantum applications, our commercial X-band microwave solution brings metrology-grade performance to an industry-ready platform. See how our phase-noise compares with the world’s best results in the accompanying white paper – you may do a double take.”
At the core of the system is TOPTICA’s Difference Frequency Comb technology, which enables intrinsically offset-free operation and contributes to both low noise and long-term stability. The platform can also be referenced to external standards such as atomic clocks or GPS signals, ensuring SI-traceable measurements for real-world applications.
Bringing Ultra-Pure Microwaves to Applications
Metrology-grade local-oscillator performance opens new possibilities in advanced test and measurement and in the development of compact, high-end RF systems. X-MMS enables faster, more accurate measurements and accelerates high-end RF development. This development reflects a broader trend in photonics, where advances in laser and frequency comb technologies are enabling the transfer of scientific breakthroughs into practical tools for industry.
The full technical background and performance data are outlined in a recently published white paper "X-BAND METROLOGICAL MICROWAVE SOLUTION" by Sebastian Müller, Dr. Mikhail Volkov, and Dr. Thomas Puppe.
TOPTICA Launches TeraScan ultra: Redefining Terahertz Precision with 1 Hz Spectral Resolution
TOPTICA Photonics, a global leader in precision laser systems, proudly announces the launch of the TeraScan ultra – an ultra-high-precision continuous-wave (cw) terahertz platform featuring comb-locked stability and unmatched spectral resolution down to 1 Hz.
The TeraScan ultra is designed to meet the most demanding requirements in THz communications research, channel sounding, wafer inspection, and high-resolution spectroscopy. With a bandwidth of up to 5 THz and ultra-low phase noise, it sets a new benchmark in the generation and control of tunable terahertz radiation.
At the heart of the system are two diode lasers – one tunable, one fixed – both locked to a single optical frequency comb. A photomixer emitter converts the optical beat signal into a tunable, monochromatic THz wave. TOPTICA’s proprietary “endless frequency shifter” ensures seamless frequency tuning while maintaining absolute control over phase and frequency – a crucial requirement for applications like photonic vector network analysis.
The system uses state-of-the-art InGaAs photomixers: a photodiode emitter and a Rh:InGaAs photomixer receiver, both packaged into compact, fiber-coupled modules. Operation modes include fixed frequency, sweep, and triggered step scan – fully software-controlled.
TOPTICA’s TeraScan ultra is ideal for researchers who demand ultimate frequency stability, scanning flexibility, and sub-Hz phase coherence across the full terahertz spectrum.
Request a demo or learn more at: www.toptica.com/resolution
TOPTICA Photonics, a global leader in precision laser systems, proudly announces the launch of the TeraScan ultra – an ultra-high-precision continuous-wave (cw) terahertz platform featuring comb-locked stability and unmatched spectral resolution down to 1 Hz.
The TeraScan ultra is designed to meet the most demanding requirements in THz communications research, channel sounding, wafer inspection, and high-resolution spectroscopy. With a bandwidth of up to 5 THz and ultra-low phase noise, it sets a new benchmark in the generation and control of tunable terahertz radiation.
At the heart of the system are two diode lasers – one tunable, one fixed – both locked to a single optical frequency comb. A photomixer emitter converts the optical beat signal into a tunable, monochromatic THz wave. TOPTICA’s proprietary “endless frequency shifter” ensures seamless frequency tuning while maintaining absolute control over phase and frequency – a crucial requirement for applications like photonic vector network analysis.
The system uses state-of-the-art InGaAs photomixers: a photodiode emitter and a Rh:InGaAs photomixer receiver, both packaged into compact, fiber-coupled modules. Operation modes include fixed frequency, sweep, and triggered step scan – fully software-controlled.
TOPTICA’s TeraScan ultra is ideal for researchers who demand ultimate frequency stability, scanning flexibility, and sub-Hz phase coherence across the full terahertz spectrum.
